دانلود کتاب میکروسکوپ نیروی اتمی - تصویر برداری، اندازه گیری و دستکاری سطوح در مقیاس اتمی

With the advent of the atomic force microscope (AFM) came an extremely valuable analytical resource and technique, useful for the qualitative and quantitative surface analysis with sub-nanometer resolution. In addition, samples studied with an AFM do not require any special pretreatments that may alter or damage the sample, and permit a three dimensional investigation of the surface. This book presents a collection of current research from scientists throughout the world who employ atomic force microscopy in their investigations. The technique has become widely accepted and used in obtaining valuable data in a wide variety of fields. It is impressive to see how it has proliferated and found many uses throughout manufacturing, research and development in the short time period since its development in 1986